By Speakman J

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Ginley, Journal of Undergraduate Research, 2005, 5, 24. 8. J. Ouyanga, Q. -W Chua, Y. Yanga, G. Lib and J. Shinarb, Polymer, 2004, 45, 8443. 9. A-S Yang, C-H Cheng and C-T Lin in Proceedings of the Institute of Mechanical Engineering Part C: Journal of Mechanical Engineering Science, 2006, 220, 4, 435. 10. M. Jonsson, J. Brigerson and X. Chrispin, Synthetic Metals, 2003, 139, 1. 1 Introduction Electric and electronic products have gained increasing importance in a number of industries. Becoming ever more complex, they are being used in highly integrated assembly groups.

Y-Y. Noh, N. Zhao, M. Caironi and H. Sirringhaus, Nature Nanotechnology, 2007, 2, 12, 784. 9. R. Small and M. in het Panhuis, Small, 2007, 3, 9, 1500. 10. P. G. J. I. Milne, A. A. Gardner, E. G. Steinke, Organic Electronics, 2001, 2, 2, 65. 11. T. Kawase, S. J. Newsome and T. Shimoda, Japanese Journal of Applied Physics, 2005, 44, 1, 6A, 3649. 12. T. Someya, Y. Kato, T. Sekitani, S. Iba, Y. Nguchi, Y. Murase, H. Kawaguchi and T. Sakurai, Proceedings of the National Academy of Sciences, 2005, 102, 35, 12321.

Wavy edges were photolithographically patterned in the S/D electrodes and TFT performance and operation stability were tested [16]. Stress bias-dependent operation instability was shown by a-Si:H TFT. Threshold voltage 16 Technical Issues in Printed Electrodes for All-Printed Thin-Film Transistor Applications shift was relatively independent of peak-to-peak magnitude of the wavy edges. It was also observed that when TFT were stressed in a constant current mode, the threshold voltage shift demonstrated a large dependency on the peak-to-peak magnitude variations.

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An introduction to the electronic theory of valency by Speakman J

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